Page 60 - PEN eBook July 2023
P. 60

Test & Measurement



            In  recent  years,  wide-bandgap  (WBG)  devices  have  made  significant  progress  in  replacing
            silicon-based power MOSFETs and IGBTs in many power-related applications. Their fundamental
            characteristics  enable  significant  improvements  in  key  areas  for  power  applications.  When

            comparing GaN with silicon, it is well known that GaN’s higher bandgap, higher electron mobility
            and larger electric-field potential enable important attributes, such as lower losses (i.e., higher
            efficiency), faster switching and a significantly reduced size (i.e., higher power density). However,
            WBG devices have a much shorter history of use in a variety of power applications compared with
            silicon, especially “high uptime” applications like automotive.


            JEDEC formed the JC-70 Committee in 2017 to develop needed new reliability, characterization,
            test methods and datasheet enhancements to appropriately characterize GaN and SiC WBG power
            devices. The  existing  Si-based  standards were  not  sufficient to  enable  designers to  determine

            the most appropriate WBG devices for their application. For example, on-resistance (R      ), the
                                                                                                    DS(on)
            main parameter characterizing conduction losses, is a dynamic phenomenon in GaN, based on
            the charge being trapped in the transistor structure (current collapse). JEP-173 was JC-70’s first
            publication (issued in January 2019) to provide a standard for “dynamic on-resistance test method
            guidelines for GaN HEMT–based power-conversion devices.”


            EXAMPLES OF LOW-VOLTAGE GaN FET APPLICATIONS

            One application of the initial Class D audio amplifiers was sound systems for automobiles. The
            amplifier’s lower power dissipation and superior efficiency (>90%), compared with Class A amplifiers,
            enabled “limited power” automobiles the ability to have multiple speakers and more sound (>100 W).
            However,  the  tradeoff  for  less  power  consumption  was  higher  total  harmonic  distortion  (THD),
            created by slower-switching power Si MOSFETs. GaN FETs with significantly faster switching speeds
            (up to 10×) and no reverse-recovery charge provide a superior linear response and significantly
            reduced THD.


            In  addition  to  automotive  applications,  you’ve  probably  noticed  the  recent  boom  in  portable

            speakers.  As  well  as  advances  in  battery  technology,  this  application  is  enabled  by  efficient,
            compact Class D audio amplifiers designed with GaN FETs. Good audio quality is provided because
            of the lower-distortion attributes of GaN, while the ability to run for extended times on batteries
            is possible because of GaN’s high efficiency. There are many other portable consumer devices that
            can leverage the same attributes as portable speakers.


            Automotive  systems  are  moving toward  higher-voltage  operation  (e.g.,  48 V)  as  more  electrical

            power  needs  develop for  autonomous  driving,  including  radar,  cameras,  ultrasonic  sensors  and
            LiDAR. These functions require uninterrupted, highly reliable power. As the 48-V bus emerges as
            one  of the  new  higher-voltage  power  systems,  efficiency  is  again the  key with  a  limited  power
            source  (i.e.,  car  battery).  GaN technology  enables  better  power  density than  silicon,  minimizing
            additional weight, size and thermal management. GaN’s higher-frequency switching and increased




  60        JULY 2023 | www.powerelectronicsnews.com
   55   56   57   58   59   60   61   62   63   64   65