Page 59 - PEN eBook July 2023
P. 59
TEST & MEASUREMENT
Accurate
Characterization
of Low-Voltage,
Small-Form–Factor
GaN FETs
By Ryo Takeda, solution architect at Keysight Technologies; Takamasa Arai,
application engineer at Keysight Technologies; Ron Simpson, proprietor
of GRAD Engineering LLC; and Mike Hawes, power solution consultant at
Keysight Technologies
Applications for 100-V (and lower) GaN FETs are numerous, from reducing distortion in Class D
audio amplifiers to improving efficiency in synchronous rectifiers and motor drives. They are also
popular in 48-V automotive and server applications, as well as USB-C, LiDAR and LED lighting.
However, the small size and minimal packaging parasitics create multiple challenges to dynamically
characterize these power devices. This article reviews the challenges that GaN semiconductor
manufacturers face to characterize these devices, as well as some new technologies that help
address these challenges.
JULY 2023 | www.powerelectronicsnews.com 59
