Page 42 - PEN Ebook May 2021
P. 42

Semiconductors                                                                                                                                                                                             Semiconductors


          phase and in the modeling of C-V and I-V charac-     istics and it is expected to provide much more

          teristics. Different aspects have been concluded     guidance that is valuable for the power converter                        ▶ [8] Z. Chen, “Characterization and modeling of high-switching-speed be- havior of
          based on the comparison between simulation           having High Frequency HF and high-density de-                           SiC active devices,” Master’s thesis, Virginia Polytechnic Institute and State Univ.,
          and experiment. It can be concluded that the         signing with SiC MOSFET.                                                Blacksburg, USA, 2009.
          model experimented here has the ability of com-

          For More Information                                                                                                          ▶ [9] M. R. Ahmed, R. Todd, and A. J. Forsyth, “Predicting SiC MOSFET behavior under

                                                                                                                                       hard-switching, soft-Switching, and false turn-on condi- tions,” IEEE Transactions
                                                                                                                                       on Industrial Electronics, vol. 64, no. 11, pp. 9001–9011, 2017.
                 ▶ [1] S. Yin, K. J. Tseng, R. Simanjorang, Y. Liu, and J. Pou, “A 50-kW high-frequency

                and high-efficiency SiC voltage source inverter for more electric aircraft,” IEEE
                                                                                                                                        ▶ [10] J. Wang, H. S.-h. Chung, and R. T.-h. Li, “Characterization and experimental
                Trans. Ind. Electro., vol. 64, no. 11, pp. 9124– 9134, 2017.
                                                                                                                                       assessment of the effects of parasitic elements on the MOS- FET switching

                                                                                                                                       performance,” IEEE Transactions on Power Electronics, vol. 28, no. 1, pp. 573–590,
                 ▶ [2] F. Wang, Z. Zhang, T. Ericsen, R. Raju, R. Burgos, and D. Boroyevich, “Advances in
                                                                                                                                       2013.
                Power Conversion and Drives for Shipboard Systems,” Proceedings of the IEEE, vol.
                103, no. 12, pp. 2285–2311, 2015.
                                                                                                                                        ▶ [11] M. Liang, T. Q. Zheng, and Y. Li, “An Improved Analytical Model for Predicting

                                                                                                                                       the Switching Performance of SiC MOSFETs,” Journal of Power Electronics, vol. 16,
                 ▶ [3] X.Ding, M.Du, T. Zhou, H. Guo and C. Zhang, “Comprehensive comparison
                                                                                                                                       no. 1, pp. 374–387, 2016.
                between silicon carbide MOSFETs and silicon IGBTs based traction systems for

                electric vehicles,” Applied energy, vol. 194, pp. 626– 634, 2017.
                                                                                                                                        ▶ [12] X.Wang,Z.Zhao,K.Li,Y.Zhu,andK.Chen,“Analytical Methodology for Loss

                                                                                                                                       Calculation of SiC MOSFETs,” IEEE Journal of Emerging and Selected Topics in
                 ▶ [4] X. She, A. Q. Huang, O. Lucia, and B. Ozpineci, “Review of silicon carbide power
                                                                                                                                       Power Electronics, vol. 7, no. 1, pp. 71–83, 2019.
                devices and their applications,” IEEE Transactions on Industrial Electronics, vol. 64,

                no. 10, pp. 8193–8205, 2017.
                                                                                                                                        ▶ [13] T. Liu, R. Ning, T. T. Y. Wong, and Z. J. Shen, “Modeling and analysis of SiC
                                                                                                                                       MOSFET switching oscillations,” IEEE Journal of Emerging and Selected Topics in
                 ▶ [5] L. Zhang, X. Yuan, X. Wu, C. Shi, J. Zhang, and Y. Zhang, “Performance evaluation
                                                                                                                                       Power Electronics, vol. 4, no. 3, pp. 747–756, 2016.
                of high-power SiC MOSFET modules in comparison to Si IGBT modules,” IEEE

                Transactions on Power Electronics, vol. 34, no. 2, pp. 1181–1196, 2019.
                                                                                                                                        ▶ [14] Analytical Modeling of Switching Characteristics of the SiC MOSFET Based on
                                                                                                                                       Finite State Machine Yingzhe Wu1 , Shan Yin2 , and Hui Li1 1 School of Astronautics
                 ▶ [6] T. R. McNutt, A. R. Hefner, H. A. Mantooth, D. Berning, and S.-H. Ryu, “Silicon
                                                                                                                                       and Aeronautics, University of Electronic Science and Technology of China,
                carbide power MOSFET model and parameter extraction sequence,” IEEE
                                                                                                                                       Chengdu, China 2 Microsystem & Terahertz Research Center, China Academy of
                Transactions on Power Electronics, vol. 22, no. 2, pp. 353–363, 2007.
                                                                                                                                       Engineering Physics, Chengdu, China

                 ▶ [7] S. Yin, P. Tu, P. Wang, K. J. Tseng, C. Qi, X. Hu, M. Zagrodnik, and R. Simanjorang,

                “An accurate subcircuit model of SiC half-bridge module for switching-loss
                optimization,” IEEE Transactions on Industry Applications, vol. 53, no. 4, pp. 3840–

                3848, 2017.




  42      MAY 2021 | www.powerelectronicsnews.com                                                                                                                                              MAY 2021 | www.powerelectronicsnews.com      43
          prehensively assessing the switching character-
   37   38   39   40   41   42   43   44   45   46   47