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Semiconductors                                                                               Semiconductors


 phase and in the modeling of C-V and I-V charac-  istics and it is expected to provide much more

 teristics. Different aspects have been concluded   guidance that is valuable for the power converter     ▶ [8] Z. Chen, “Characterization and modeling of high-switching-speed be- havior of
 based on the comparison between simulation   having High Frequency HF and high-density de-  SiC active devices,” Master’s thesis, Virginia Polytechnic Institute and State Univ.,
 and experiment. It can be concluded that the   signing with SiC MOSFET.  Blacksburg, USA, 2009.
 model experimented here has the ability of com-

 For More Information    ▶ [9] M. R. Ahmed, R. Todd, and A. J. Forsyth, “Predicting SiC MOSFET behavior under

                hard-switching, soft-Switching, and false turn-on condi- tions,” IEEE Transactions
                on Industrial Electronics, vol. 64, no. 11, pp. 9001–9011, 2017.
   ▶ [1] S. Yin, K. J. Tseng, R. Simanjorang, Y. Liu, and J. Pou, “A 50-kW high-frequency

 and high-efficiency SiC voltage source inverter for more electric aircraft,” IEEE
                 ▶ [10] J. Wang, H. S.-h. Chung, and R. T.-h. Li, “Characterization and experimental
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                assessment of the effects of parasitic elements on the MOS- FET switching

                performance,” IEEE Transactions on Power Electronics, vol. 28, no. 1, pp. 573–590,
   ▶ [2] F. Wang, Z. Zhang, T. Ericsen, R. Raju, R. Burgos, and D. Boroyevich, “Advances in
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                 ▶ [11] M. Liang, T. Q. Zheng, and Y. Li, “An Improved Analytical Model for Predicting

                the Switching Performance of SiC MOSFETs,” Journal of Power Electronics, vol. 16,
   ▶ [3] X.Ding, M.Du, T. Zhou, H. Guo and C. Zhang, “Comprehensive comparison
                no. 1, pp. 374–387, 2016.
 between silicon carbide MOSFETs and silicon IGBTs based traction systems for

 electric vehicles,” Applied energy, vol. 194, pp. 626– 634, 2017.
                 ▶ [12] X.Wang,Z.Zhao,K.Li,Y.Zhu,andK.Chen,“Analytical Methodology for Loss

                Calculation of SiC MOSFETs,” IEEE Journal of Emerging and Selected Topics in
   ▶ [4] X. She, A. Q. Huang, O. Lucia, and B. Ozpineci, “Review of silicon carbide power
                Power Electronics, vol. 7, no. 1, pp. 71–83, 2019.
 devices and their applications,” IEEE Transactions on Industrial Electronics, vol. 64,

 no. 10, pp. 8193–8205, 2017.
                 ▶ [13] T. Liu, R. Ning, T. T. Y. Wong, and Z. J. Shen, “Modeling and analysis of SiC
                MOSFET switching oscillations,” IEEE Journal of Emerging and Selected Topics in
   ▶ [5] L. Zhang, X. Yuan, X. Wu, C. Shi, J. Zhang, and Y. Zhang, “Performance evaluation
                Power Electronics, vol. 4, no. 3, pp. 747–756, 2016.
 of high-power SiC MOSFET modules in comparison to Si IGBT modules,” IEEE

 Transactions on Power Electronics, vol. 34, no. 2, pp. 1181–1196, 2019.
                 ▶ [14] Analytical Modeling of Switching Characteristics of the SiC MOSFET Based on
                Finite State Machine Yingzhe Wu1 , Shan Yin2 , and Hui Li1 1 School of Astronautics
   ▶ [6] T. R. McNutt, A. R. Hefner, H. A. Mantooth, D. Berning, and S.-H. Ryu, “Silicon
                and Aeronautics, University of Electronic Science and Technology of China,
 carbide power MOSFET model and parameter extraction sequence,” IEEE
                Chengdu, China 2 Microsystem & Terahertz Research Center, China Academy of
 Transactions on Power Electronics, vol. 22, no. 2, pp. 353–363, 2007.
                Engineering Physics, Chengdu, China

   ▶ [7] S. Yin, P. Tu, P. Wang, K. J. Tseng, C. Qi, X. Hu, M. Zagrodnik, and R. Simanjorang,

 “An accurate subcircuit model of SiC half-bridge module for switching-loss
 optimization,” IEEE Transactions on Industry Applications, vol. 53, no. 4, pp. 3840–

 3848, 2017.




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