Page 24 - PEN_Ebook_December_2021
P. 24
Test&Measurements TEST&MEASUREMENTS
SUMMARY Choosing the Right
This article explored the challenge of supplying a highly dynamic load with a stable voltage using
a power supply located several feet away from the device under test. Although the load lead Hardware Solution for
impedance can severely degrade the transient response performance of a high-performance power
supply, with mitigation practices, you can achieve the required performance at the device under
test. Techniques such as twisting load lead wiring to minimize the loop area formed between the Low-Power Validation
supply and return lines, using flat copper, or heavy gauge coaxial cables can significantly reduce
the load lead inductance. Properly sizing a bypass capacitor network at the device under test can By David Hall, global go-to-market director; Macarena Calderon, staff content
further improve voltage-level stability in the face of fast current transients drawn by the device manager; Mike Denton, chief product planner; and Paul Ulezko, product
under test. marketing engineer in the semiconductor business unit, all at NI
In an increasingly connected world, electronic devices are becoming smarter, and the balance
between battery performance and longevity has never been more important. A “low battery” alert
creates a significant inconvenience regardless of the application. From wireless headphones at the
gym to digital grocery lists on smartphones, consumers rely on battery-powered devices every day.
What’s more, they expect these devices to stay powered on longer with a single charge. This means
that engineers are consistently challenged with maximizing their electronics’ battery life.
One of the main requirements for extended battery life is being able to accurately measure the
For More Information device’s total power consumption. The main challenge lies in the fact that the total load power is not
limited to power-on and a steady-state operation but requires measurements in multiple operating
states. Low-power conditions like sleep and transient states can generate incorrect data readings
▶ Keysight’s Optimize Power Source Integrity Under Large Load Transients due to the low voltages that need to be measured, often in the nanovolt (nV) range. Additionally,
application note some power events can last for short periods of time. This means that, in addition to needing highly
accurate measurement instruments, having fast sampling rates is also a key consideration.
36 DECEMBER 2021 | www.powerelectronicsnews.com DECEMBER 2021 | www.powerelectronicsnews.com 37
