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Test&Measurements

EVALUATING THE INSTRUMENTS TO FIND THE RIGHT FIT FOR AspenCore Guide

LOW-POWER VALIDATION
As mentioned previously, accuracy is one of the most important considerations when evaluating to Gallium Nitride

instruments for low-voltage measurements. Additionally, features like the fast-sampling rate capture
data for dynamic signals. Beyond that, additional channels provide the adaptability to measure
multiple power rails. The overall results showed that, although most instruments are equipped for A New Era for Power Electronics
voltage readings, there is a significant variance of accuracy. First, DMMs would be able to accurately
read active- and low-power modes. Second, the oscilloscope is best-suited for capturing dynamic As silicon reaches its theoretical performance limits for power electronics,
signals due to their high sampling rate. Third, DAQ PXIe-6289 would be sufficient to read active- industry is shifting toward wide-bandgap materials like gallium nitride
power mode but would not be sufficient to measure low-power mode. Finally, PXIe-4309 would be (GaN), whose properties provide clear benefits in power converters for
able to accurately measure both the active- and low-power mode needed in Figure 1. consumer and industrial electronics. This book delves into GaN technology

and its importance for power electronics professionals engaged with its
Choosing the right tool to measure low power leads to more accurate power validation, which, in implementation in power devices.
turn, enhances product performance. In a market where consumers expect their electronic devices
to stay powered on longer with a single charge, selecting high-performance instrumentation like the
PXIe-4309 can help quickly and effectively validate your device’s power consumption. Overall, the Foreword: Alex Lidow, CEO of Efficient

PXIe-4309 analog input module outperforms oscilloscopes and comparable DAQ devices. It even Power Conversion (EPC)
matches the performance of a 7 ½-digit DMM for measuring current on these low-ohm shunt resistors. Market Overview: Yole Développement
With a higher channel count, the PXIe-4309 provides enough measurement density for requirements

of modern power validation in complex electronic designs. Technology Analysis: Elena Barbarini, System Plus
Consulting; Filippo Di Giovanni, STMicroelectronics;
Alex Lidow, EPC; Chris Lee, Power Integrations; Dilder
Chowdhury, Nexperia; Stephen Oliver and Dan
Kinzer, Navitas Semiconductor; Stefano Lovati and
Davide Di Gesualdo, EEWeb; Paul Wiener, GaN Systems;
and Professor Alex Q. Huang, Tianxiang Chen, and
Ruiyang Yu, University of Texas at Austin. In addition,
there are reports from Jens Tybo Jensen, Jun Honda,
and Pawan Garg, Infineon Technologies; Max Zafrani,

EPC Space; Kasyap Patel, Wolfspeed, a Cree Company;
Andrea Vinci, Tektronix; and Gerald Deboy,
Infineon Technologies.

Tech papers: Keysight, onsemi, Cadence,
United Monolithic Semiconductors, Transphorm,
For More Information Nexperia, and CEA-Leti

▶ Visit NI’s website to learn more. ONLINE BOOKSTORE:
www.eetimes.com/shop
▶ To learn more about performing offset nulling, visit NI Digital Multimeters
Help (NI-DMM 18.1): Performing Offset Nulling.

Edited by Maurizio Di Paolo Emilio, Nitin Dahad, EE Times
Publisher: AspenCore Media
Available in PDF and Hard Copy (Limited Edition)
46 DECEMBER 2021 | www.powerelectronicsnews.com DECEMBER 2021 | www.powerelectronicsnews.com 47