Page 12 - PEN eBook February 2024
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SEMICONDUCTORS                                                                                                                                                                                                  SEMICONDUCTORS































                                                                                                                                 Figure 6: Hard-switching 100-kHz, 400- to 230-V buck converter waveform and efficiency curve for the 650-V top-side–cooled
                                                                                                                                 650-V GaN in the CCPAK package (Source: Nexperia)
          Figure 5: Comparing board reliability during temperature cycling between the CCPAK and QFN/DFN packages (Source:
          Nexperia)
                                                                                                                                                                                     power-switching applications. GaN HEMTs, with their
                                                                                                                                                                                     low reverse-recovery losses, allow for the use of
           ▶  A lower thermal resistance (R ) and package-       level benefits. The total source-drain inductance                                                                   simpler topologies, such as the totem pole for the PFC
                                     th
            added electrical resistance. The large cross-        in the CCPAK1212 package is only 1.2 nH.                                                                            stage. The much higher switching frequencies with GaN
            sectional area of Cu improves both electrical and    In comparison, the same for a competitor’s SiC                                                                      can result in improved power densities and reduced
            thermal performance compared with traditional        device in a leadless TOLL package was 2 nH.                                                                         system cost with smaller magnetics.
            wire-bonded packages. This is true even though
            the package can be much smaller in size in         ▶  Improved board-level reliability compared with                                                                      An example application is a single-phase solar
            comparison. Soldering the clip directly to the       traditional QFN/DFN surface-mounted packages.                                                                       inverter. A simplified block diagram of this is shown in
            source connection on the die helps prevent areas     As shown in Figure 5, the CCPAK has exposed,                                                                        Figure 8. Half-bridge GaN devices can be used for the
            of high current density seen with bond wires         flexible, gull-winged leads. This allows the                                                                        MPPT and DC/DC boost of the incoming PV voltage,
            and the resultant hot spots. This also improves      CCPAK pins to absorb stress related to thermal                                                                      while the high-switching GaN devices in the inverter
            reliability at higher power levels. As an example,   expansions and contractions from temperature                                                                        can reduce the size of the line filters and magnetics.
            the maximum junction to mounting base                cycling. In contrast, the fully encapsulated leads
            (R th(j-mb) ) of the Nexperia TO-247–packaged 650-V   in the QFN/DFN packages do not allow any
            GaN device GAN041-650WSB, rated at a typical         movement in the leads, meaning the solder joint                 Figure 7: Soft-switching 1-MHz converter switching loss
            on-state resistance R DS(on)  of 35 mΩ, is specified   absorbs a lot of the stress, creating risks of joint          comparisons (Source: Nexperia)
            at 0.8 K/W. The datasheet of the upcoming 650-V      degradation with temperature cycling. Cracks in
            CCPAK1212 top-side–cooled device                     the mold also create the risk of early failure in                The switching loss comparison of a resonant soft-
            GAN039-650NTB, rated at a typical R DS(on)  of       the package.                                                    switching converter at a 400-V DC bus voltage and
            33 mΩ, specifies the maximum R th(j-mb)  at 0.5 K/W.                                                                 switching at 1 MHz is shown in Figure 7. The CCPAK
                                                                                                                                 GaN device is a lower R DS(on)  compared with the rest of
           ▶  Lower parasitic inductance. Compared with       CASCODE GaN PERFORMANCE IN                                         the devices shown in Figure 7 and would hence exhibit
            wire-bonded packages, the parasitic package       CCPAK                                                              greater parasitic switching losses for the same FOM.
            inductance of the Cu-clip packages can be up       The 650-V top-side–cooled CCPAK GaN performance                   However, the clear FOM advantages of GaN, as well as
            to 3× lower. This results in improved switching   was evaluated under both hard-switching and soft-                  the cascode and CCPAK package advantages, result in
            efficiency and lower electromagnetic interference   switching conditions. Figure 6 shows the switching               a much lower switching loss for this device compared
            during switching transitions. This can be         performance of a hard-switching 400-V to 230-V buck                with the silicon, SiC and e-mode GaN devices.
            especially important in GaN power devices. Their   converter operating a 100-kHz switching frequency.
            low device capacitances and improved switching    The excellent R  allows for high efficiency (>98%) in this          The cascode architecture and the CCPAK package
                                                                           th
            figures of merit (FOMs) allow for much faster     fan-cooled application for power as high as 6 kW.                  together serve some of GaN’s inherent benefits to a
            switching frequencies and transitions. Having low   The switching waveform shows a fast rise time of about           greater extent. The new 33-mΩ 650-V GaN FETs from
            package inductances enables this to be achieved   7 ns, with an overshoot of less than 20 V.                         Nexperia, offered in a top-side– and bottom-side–   Figure 8: A simplified block diagram of a single-phase solar
                                                                                                                                                                                     inverter showing the use of GaN in the DC/DC boost stage, as
            at smaller overshoot levels, providing system-                                                                       cooled CCPAK package, provide many advantages in    well as the inverter (Source: Nexperia)

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