Page 6 - PEN eBook May 2023
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COVER STORY – DESIGN                                                                                                                                                                                        COVER STORY – DESIGN

                                                                                                                                 that restricted the current-handling capabilities of   charge (Q ) required to turn on the transistor. In the
                                                                                                                                                                                              g
                                                                                                                                 the VDMOS. In medium-voltage VDMOS, the intrinsic   case of high-switching–frequency applications, the
                                                                                                                                 channel resistance and the JFET region—which restrict   lowest gate charge is desirable, as it proportionally
                                                                                                                                 the channel current flow into the epitaxially-grown drift   reduces the driving losses. A part of the total gate
                                                                                                                                 region—were the primary contributors to the total   charge is associated with the gate-to-drain charge
                                                                                                                                 on-state resistance (R DS(on) ) between the drain and   (Q ), which governs the drain-voltage transient. A
                                                                                                                                                                                       gd
                                                                                                                                 source (Figure 1a).                                 higher Q  impacts the transient speed, increases
                                                                                                                                                                                             gd
                                                                                                                                                                                     the switching losses and forces the use of longer
                                                                                                                                  It took more than a decade of device design and    deadtimes. It became evident that specific measures
                                                                                                                                 process engineering progress to overcome this       were needed to reduce the overall gate and gate-drain
                                                                                                                                 limitation, which finally led to the commercialization   charge.
                                                                                                                                 of the first trench-gate MOSFETs in the late 1980s.
                                                                                                                                 By moving the channel in the vertical direction, this   A new era started with the introduction of
                                                                                                                                 device concept enabled a reduction in cell pitch    charge-compensated structures, exploiting the same
                                                                                                                                 without negatively affecting current spreading. The   principle as superjunction devices. Introducing devices
                                                                                                                                 virtual elimination of the JFET region dramatically   that use an insulated deep field plate as an extension
                                                                                                                                 decreased the on-state resistance (Figure 1b).      of the gate electrode enabled the lateral depletion
                                                                                                                                 Nevertheless, the significant increase in cell density not   of the drift region in the off state (Figure 1c).  The
                                                                                                                                                                                                                             2
                                                                                                                                 only established the trench MOSFET as a competitive   lateral depletion alters the electric field distribution
                                                                                                                                 alternative to planar technology but also brought   throughout the structure, allowing the same voltage
                                                                                                                                 substantial drawbacks to light.                     to be blocked within a shorter length. Because the
                                                                                                                                                                                     electric field can now be supported by a thinner and
          Accelerating the Drive                                                                                                 penetration in the epi drift region) and gate-source   more heavily doped drift region, a substantial reduction
                                                                                                                                  The gate-drain capacitance (related to trench-gate
                                                                                                                                                                                     in the on-state resistance can be achieved. It is worth
          for Higher Efficiencies                                                                                                capacitance (overall capacitance between trench gate   noticing that the field plate (as an extension of the gate
                                                                                                                                                                                     electrode) leads to both a significant increase of the
                                                                                                                                 and body/source diffusion) increase linearly with the
                                                                                                                                                                                     reverse-transfer capacitance C  (hence also Q  and
                                                                                                                                 number of trenches, i.e., with the cell density. Together
                                                                                                                                                                                                                              gd
                                                                                                                                                                                                                 gd
                                                                                                                                                                                     Q ) and a nonlinear dependence on the drain voltage.
                                                                                                                                 with a sublinear scaling in the on-resistance, this
          Through Power MOSFET                                                                                                   significantly impacts the technology figure of merit   soon as the mesa region completely depletes. These
                                                                                                                                                                                       g
                                                                                                                                 (FOM) FOM  = R
                                                                                                                                                                                      In fact, the transfer capacitance drops abruptly as
                                                                                                                                                   × Q . Because the MOSFET is
                                                                                                                                          g
                                                                                                                                              DS(on)
                                                                                                                                                     g
                                                                                                                                 uniquely controlled through its gate terminal, the
          Technology Innovation                                                                                                  gate-driver circuitry has to provide the total gate   disadvantages were soon overcome by using a field
          Introducing Infineon’s latest OptiMOS™ 6 device
          technology—a novel cell-design approach for higher

          power densities and cost-effectiveness


          By Ralf Siemieniec, Senior Principal Engineer Power Device Development; Simone
          Mazzer, Senior Engineer Product Applications; Cesar Braz, Principal Engineer Product
          Definition; Michael Hutzler, Lead Principal Engineer Technology Development; David
          Laforet, Lead Principal Engineer Technology Development; Ingmar Neumann, Principal
          Engineer Technology Development; Elias Pree, Senior Staff Engineer Technology
          Development; and Alessandro Ferrara, Principal Engineer Product Concept, all at
          Infineon Technologies


           MOSFET technology has been widely recognized as    switch. Due to its superior switching performance and
                                                                    1
          an excellent option for switches in power management   high input impedance, the MOSFET quickly emerged
          circuits since its inception. Commercially available   as an attractive alternative to bipolar technologies.
          since the late 1970s, vertical diffused MOSFET (VDMOS)   However, its application in the power electronics
          structures were the first to fulfill the need for a power   industry was limited by the high on-state resistance       Figure 1: Exemplary device structures depicting the evolution of a power MOSFET

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