Page 21 - PEN eBook March 2023
P. 21

DESIGN                                                                                              Design



            loss, improved efficiency, simpler converter topologies and significantly improved high-temperature
            ratings and performance, as well as reduced size, weight and system costs.



            The packaging of these high-voltage (HV, >3.3-kV–rated) SiC devices and modules for use in these
            MV grid applications poses several challenges. This article summarizes work done by Professor
            Christina DiMarino and her group at  the  Virginia Tech  Center  for  Power  Electronics  Systems
            (CPES) on high-density, high-speed 10-kV SiC power module packaging. CPES focuses on research
            and development dedicated to improving electrical power-processing and -distribution systems,
            including power-conversion architectures, power-electronics components, modeling, power quality
            and high-density integration.


            CHALLENGES IN HV SiC DEVICE/MODULE PACKAGING



             ▶   Due  to  their  faster  switching  speeds,  SiC  devices  are  more  sensitive  to  parasitic
                inductances from the packaging. These can resonate with the device capacitances, causing
                undesirable  electromagnetic  interference.  During  high-speed  current  transients  (di/dt),
 SiC Power Module   large overvoltages can be created across the device, which can degrade device reliability

                or cause catastrophic fails.
 Packaging Solutions for   ▶   Parallel devices are often used to achieve module current ratings. Imbalances in parasitic

                inductances/capacitances or static device parameters like the threshold voltage can result
 MV Grid Applications  in varying transient voltage overshoots across the paralleled die. Die with higher overshoots
                will see greater switching losses and thus higher temperatures. This can reduce module
                lifetimes. External gate resistors are commonly added to control overshoots; however, these
 By Sonu Daryanani, contributing writer for Power Electronics News  increase switching times and hence losses. Low-inductance wire-bondless interconnect
                schemes have been proposed,  for example,  with metal-post–interconnected parallel
                plates.  Decoupling capacitors can be used to mitigate the impact of parasitic inductance.
                       2
 Some  of  the  power-electronics  applications  in  medium-voltage  (MV)  power-distribution and   One approach places the capacitors above the power device, creating a vertical power loop
 -conversion applications in the range of 1–35 kV include grid-tied inverters and DC/DC converters   that keeps the horizontal module footprint unchanged. 3

 for renewable energy systems like solar, power management and interruption devices, such as   ▶   Traditional power modules include a parasitic capacitance across the insulating ceramic
 solid-state circuit breakers, DC/DC converters  for DC microgrids  and battery-storage systems   substrate (such as direct-bonded copper, or DBC) to the heatsink, which is generally at
 1
 needing bidirectional inverters.  ground potential. Under higher-voltage transients (dV/dt), this capacitance becomes a path
                for common-mode (CM) current to flow through the system ground. Filters and chokes can
 These applications have traditionally relied on silicon (Si)-based devices like insulated-gate bipolar   mitigate this; however, they add cost and complexity. A screen layer can be added with the
 transistors (IGBTs). Due to their material advantages, including a wider bandgap, lower intrinsic   use of multilayer ceramic substrates, which returns the CM current back to the die while
 carrier density, higher thermal conductivity and higher saturation velocity, silicon carbide (SiC)   also reducing high-frequency noise. 4

 power devices offer a number of advantages over Si. These include a lower specific on-resistance   ▶   The high electric field created in these HV devices can exceed the breakdown strength
 (R  ) for a given voltage rating, a higher voltage rating than that available with Si (e.g., up to   of dielectric materials in the packaging. This can create partial discharge (PD), which can
 DS(on)
 15 kV for SiC MOSFETs, versus 6.5 kV for Si IGBTs) and much lower capacitances due to smaller die   damage the insulating ceramic substrate. Reducing the electric field, and thereby increasing
 sizes for a given R  . Combining the benefits of lower conduction and switching losses, higher   the PD inception voltage (PDIV), near the insulating substrate is key, as this is typically
 DS(on)
 switching frequencies and simpler cooling requirements can translate to lower power-conversion   where the PD occurs. 5




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