Page 20 - PEN eBook March 2023
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DESIGN                                                                                                                                                                                                          Design



                                                                                                                                   loss, improved efficiency, simpler converter topologies and significantly improved high-temperature
                                                                                                                                   ratings and performance, as well as reduced size, weight and system costs.



                                                                                                                                   The packaging of these high-voltage (HV, >3.3-kV–rated) SiC devices and modules for use in these
                                                                                                                                   MV grid applications poses several challenges. This article summarizes work done by Professor
                                                                                                                                   Christina DiMarino and her group at  the  Virginia Tech  Center  for  Power  Electronics  Systems
                                                                                                                                   (CPES) on high-density, high-speed 10-kV SiC power module packaging. CPES focuses on research
                                                                                                                                   and development dedicated to improving electrical power-processing and -distribution systems,
                                                                                                                                   including power-conversion architectures, power-electronics components, modeling, power quality
                                                                                                                                   and high-density integration.


                                                                                                                                   CHALLENGES IN HV SiC DEVICE/MODULE PACKAGING



                                                                                                                                     ▶   Due  to  their  faster  switching  speeds,  SiC  devices  are  more  sensitive  to  parasitic
                                                                                                                                       inductances from the packaging. These can resonate with the device capacitances, causing
                                                                                                                                       undesirable  electromagnetic  interference.  During  high-speed  current  transients  (di/dt),
            SiC Power Module                                                                                                           large overvoltages can be created across the device, which can degrade device reliability

                                                                                                                                       or cause catastrophic fails.
            Packaging Solutions for                                                                                                  ▶   Parallel devices are often used to achieve module current ratings. Imbalances in parasitic

                                                                                                                                       inductances/capacitances or static device parameters like the threshold voltage can result
            MV Grid Applications                                                                                                       in varying transient voltage overshoots across the paralleled die. Die with higher overshoots
                                                                                                                                       will see greater switching losses and thus higher temperatures. This can reduce module
                                                                                                                                       lifetimes. External gate resistors are commonly added to control overshoots; however, these
            By Sonu Daryanani, contributing writer for Power Electronics News                                                          increase switching times and hence losses. Low-inductance wire-bondless interconnect
                                                                                                                                       schemes have been proposed,  for example,  with metal-post–interconnected parallel
                                                                                                                                       plates.  Decoupling capacitors can be used to mitigate the impact of parasitic inductance.
                                                                                                                                              2
            Some  of  the  power-electronics  applications  in  medium-voltage  (MV)  power-distribution and                           One approach places the capacitors above the power device, creating a vertical power loop
            -conversion applications in the range of 1–35 kV include grid-tied inverters and DC/DC converters                          that keeps the horizontal module footprint unchanged. 3

            for renewable energy systems like solar, power management and interruption devices, such as                              ▶   Traditional power modules include a parasitic capacitance across the insulating ceramic
            solid-state circuit breakers, DC/DC converters  for DC microgrids  and battery-storage systems                             substrate (such as direct-bonded copper, or DBC) to the heatsink, which is generally at
                                                                              1
            needing bidirectional inverters.                                                                                           ground potential. Under higher-voltage transients (dV/dt), this capacitance becomes a path
                                                                                                                                       for common-mode (CM) current to flow through the system ground. Filters and chokes can
            These applications have traditionally relied on silicon (Si)-based devices like insulated-gate bipolar                     mitigate this; however, they add cost and complexity. A screen layer can be added with the
            transistors (IGBTs). Due to their material advantages, including a wider bandgap, lower intrinsic                          use of multilayer ceramic substrates, which returns the CM current back to the die while
            carrier density, higher thermal conductivity and higher saturation velocity, silicon carbide (SiC)                         also reducing high-frequency noise. 4

            power devices offer a number of advantages over Si. These include a lower specific on-resistance                         ▶   The high electric field created in these HV devices can exceed the breakdown strength
            (R    ) for a given voltage rating, a higher voltage rating than that available with Si (e.g., up to                       of dielectric materials in the packaging. This can create partial discharge (PD), which can
              DS(on)
            15 kV for SiC MOSFETs, versus 6.5 kV for Si IGBTs) and much lower capacitances due to smaller die                          damage the insulating ceramic substrate. Reducing the electric field, and thereby increasing
            sizes for a given R   . Combining the benefits of lower conduction and switching losses, higher                            the PD inception voltage (PDIV), near the insulating substrate is key, as this is typically
                               DS(on)
            switching frequencies and simpler cooling requirements can translate to lower power-conversion                             where the PD occurs. 5




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